In this study, Zn0.75Cd0.25Se ternary semiconductor thin films of thickness 1000 A0
and 2500 A0
belong to II-VI group
were deposited onto glass substrates by the vacuum deposition method under the pressure of 10-5 mbar. The effect of Zinc
content on different physics and chemical properties in Zn0.75Cd0.25Se thin films has been investigated. Systematic
characterizations of structural, morphological and compositional, properties have been carried out by XRD, SEM and EDAX.