One of the most important application of x-ray diffraction is to provide the structural details of the material to
researchers. This technique is employed on massive scale to interpret the analysis of nano crystalline phases and to determine
average crystallite sizes with the aid of diffraction angle or peak position and FWHM values on account of Scherer equation.
The phenomenon of XRD can be explained as function of reflection of incident beam from the lattice planes. These results are
also tuned for different molar density along XRD planes for any nanomaterial for molar mass and molar volume elaborated in
this paper.