International Research Journal of Engineering and Technology (IRJET)
e-ISSN: 2395-0056
Volume: 11 Issue: 04 | Apr 2024
p-ISSN: 2395-0072
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Structural Characterization of Co/Cr Superlattices Meryem Demir1,* and Sezai Elagoz2 1Aselsan Sivas Precision Optics, 58060, Sivas, Turkey Sivas Cumhuriyet University Nanophotonics Research and Application Center, 58140, Sivas, Turkey -------------------------------------------------------------------------***-----------------------------------------------------------------------Abstract
This study focuses on the structural characterization of Co/Cr superlattices. Co/Cr superlattices have attracted significant interest due to their exceptional magnetic and electronic properties, which are highly sought after in technological applications such as high-density data storage, magnetic sensing, and spintronics. The synthesis and comprehensive analysis of these superlattices are critical for unlocking their potential and tailoring their properties for specific applications. Molecular Beam Epitaxy (MBE) is a sophisticated technique for the fabrication of Co/Cr superlattices, offering unparalleled control over material deposition at the atomic level. This precision facilitates the creation of superlattices with distinct interfaces and tailored thicknesses, crucial for modulating their physical properties. X-Ray Diffraction (XRD) serves as a cornerstone technique for structural characterization, providing detailed insights into the crystalline structure and orientation of the superlattices. This study considers the detailed characterization through XRD of Co/Cr superlattices grown by using the MBE technique, aiming to highlight the potential of Co/Cr superlattices in future technological applications.
Keywords: Co/Cr superlattice, magnetoresistance, X-ray diffraction, structural characterization 1. Introduction The pursuit of materials with novel and enhanced properties for technological applications has been a key driver in the advancement of material science and nanotechnology [1, 2]. In this context, Co/Cr superlattices have garnered significant interest due to their exceptional magnetic and electronic properties, which are highly sought after in high-density data storage, magnetic sensing, and spintronics [3, 4]. The fabrication and comprehensive analysis of these superlattices are critical for unlocking their potential and tailoring their properties for specific applications [5-7]. Molecular Beam Epitaxy (MBE) stands out as a sophisticated technique for the fabrication of Co/Cr superlattices, offering unparalleled control over material deposition at the atomic level [8, 9]. This precision facilitates the creation of superlattices with distinct interfaces and tailored thicknesses, crucial for modulating their physical properties [10]. The versatility and precision of MBE have been instrumental in exploring the limits of material synthesis, enabling the engineering of superlattices with desired characteristics. Following the synthesis, the structural characterization of Co/Cr superlattices becomes imperative to understand their properties and performance [11, 12]. X-ray Diffraction (XRD) is a cornerstone technique in this regard, providing detailed insights into the crystalline structure and orientation of the superlattices. Through XRD analysis, researchers can glean information on lattice parameters, strain profiles, and the overall quality of the superlattice structure (Doe et al., 2019). This information is vital for correlating structural attributes with the magnetic and electronic behaviors of the superlattices, thereby guiding the optimization process for their application in advanced devices [13, 14]. Current study considers the detailed characterization through XRD synthesis of MBE grown Co/Cr superlattices. By examining the processes involved in their fabrication and the insights gained from XRD analysis, this study aims to shed light on the potential of Co/Cr superlattices in future technological applications. Emphasizing the importance of precise fabrication and characterization techniques, this paper will contribute to the ongoing discourse in the field, highlighting the role of Co/Cr superlattices in advancing material science and nanotechnology.
2. Materials and Method The molecular beam epitaxy (MBE) technique was employed to grow the sample, a process detailed by the parameters outlined in Table 1. Initially, the substrate temperature was raised to 590 °C within 20-30 minutes, a step essential for removing the oxide layer on the substrate surface and purifying it from oxygen. The intent behind the growth of the superlattice structure was to closely match the lattice constants of the subsequently grown layers with that of the superlattice, thereby inducing giant magnetoresistance through the formation of magnetic structures. This was achieved by
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