The aim of this project is designed to develop capacitor measurement circuit for MOS structure by using DC RC
charging discharging method. Different capacitors have different properties, such as high capacitance or variable capacitance
depending on the input voltage. This is the second most common feature in MOS architecture. To measure this variable
capacitance, it's necessary to use measuring device which is capable of changing input voltage and measuring capacitor voltage
during the all charging process. Capacitor measurement circuit done by the atmega32 and Op- Amp .Op-Amp are used for the
measured capacitor charging voltage and controller are measured charging time.
