PITOGO

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PITOGO

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6. Solution Concentration Value Developed Films Designation PAA 200 gm Pure PI PI

PAA+ITO+GO 200 gm + ITO 1.0 wt% + GO 0.05 wt% PI+ITO+GO PITOGO-1

PAA+ITO+GO 200 gm + ITO 1.0 wt% + GO 0.10 wt% PI+ITO+GO PITOGO-2

PAA+ITO+GO 200 gm + ITO 1.0 wt% + GO 0.15 wt% PI+ITO+GO PITOGO-3

PAA+ITO+GO 200 gm + ITO 1.0 wt% + GO 0.20 wt% PI+ITO+GO PITOGO-4

PAA+ITO+GO 200 gm + ITO 1.0 wt% + GO 0.25 wt% PI+ITO+GO PITOGO-5 Table 3.1: Shows the various mixed solution concentrations and designations.

B. Fourier Transform Infrared Spectrometry (FT – IR) Study The FT- IR spectrometry widely used applicable method for obtaining the exploring the chemical functional group structure and miscibility of the oxides with polymer and gives quantitative approach, which can interpret the resulting data. The Fourier Transform Infrared Spectrometry (FT-IR) of Pure PI and PITOGO composite thin films were obtained with Perkin Elmer FTIR-LX 18-5255 instrument. The FT-IR is based on the correlation between IR frequency and chemical functional group. The energy difference E between the states is related to the frequency of the radiation emitted or absorbed according to the quantum relation E=h.

C. Dynamic Thermogravimetric Analysis (TGA) Study The Perkin-Elmer TGA-7 instrument was used to perform Dynamic thermogravimetric analysis (TGA). The heating rate adopted was 10oC/min in an inert atmosphere.

D. Scanning Electron Microscopy (SEM) Study Many of the special properties of composite thin films can be explained in terms of oxide dispersion within polymeric matrix which helps to understand the surface morphological aspects. Thus SEM micrographs help analyzes the formation and texture and feature of pure PI and PITOGO composite thin films in micro/ nano domain regime and helps to yield useful data on the surface morphology and phase distribution. To obtain the micrographs a electron microscope model (SEOL-JJM-5600LV) instrument was used which was fully computerized.

E. Atomic Force Microscopy (AFM) Study To confirm the SEM micrograph imaging AFM characterization was used as it has the ability to create three-dimensional micrographs with resolution down to the micro and nano meter regime. It also helps to evaluate the phase domain morphology and analyze the mechanical interactions between ITO and GO within PI matrix along with the surface regions of the samples with varied stiffness of the constituent phase. Thus, phase images represent a compositional mapping. AFM topography of pure PI and PITOGO composite thin films were imaged using (DIAFM-4 instrument) in tapping mode.

III.RESULT AND DISCUSSION

Figure 1 shows the FT-IR absorption spectrum shows the possible chemical bonding structure of pure PI and PITOGO composite thin films. During the prime examination the physical appearance of pure PI and PITOGO composite films seems to have smooth texture. The characteristic absorption spectra of the imide unit at 1776, 1777, 1724, 1374 and 722 cm -1 wave numbers were observed for pure PI film. From figure 1 at 3470 cm-1 broad peak appeared in the high frequency area indicates the stretching mode of O-H bond, shows the presence of hydroxyl groups in GO and the band observed at 1735 cm−1 was assigned to the carboxyl group. The peak at 1345 cm -1 represents the C-OH group and the peak at 1245 cm-1 denotes C-O-C stretching along with the vibrational mode of the C-O group. The interaction of C–O bonds was absorbed at stretching frequency at 178 cm-1 and bands corresponding to stretching vibration of In–O–O–Sn appear at 1497 and 1585 cm-1. Thus confirms show the presence of indium and tin compounds along with GO within PI matrix confirming the formation of the composite.